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DOI:10.1145/2228360.2228462 - Corpus ID: 9305221
@article{Wang2012TestdataVO, title={Test-data volume optimization for diagnosis}, author={Hongfei Wang and Osei Poku and Xiaochun Yu and Sizhe Liu and Ibrahima Komara and R. D. Shawn Blanton}, journal={DAC Design Automation Conference 2012}, year={2012}, pages={567-572}, url={https://api.semanticscholar.org/CorpusID:9305221}}
- Hongfei Wang, O. Poku, R. D. Blanton
- Published in DAC Design Automation… 3 June 2012
- Computer Science, Engineering
- DAC Design Automation Conference 2012
By analyzing the failing outputs of an IC during its actual test, the developed method dynamically determines which failing test pattern to terminate testing, producing an amount of test data that is sufficient for an accurate diagnosis analysis.
50 Citations
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Topics
Failing Chips (opens in a new tab)Test Data (opens in a new tab)Fail Bit (opens in a new tab)Standard Benchmarks (opens in a new tab)
50 Citations
- Shraddha BodheM. E. AmyeenI. PomeranzS. Venkataraman
- 2016
Computer Science, Engineering
IEEE Transactions on Very Large Scale Integration…
This work presents a methodology to minimize the amount of fail data that is provided to the diagnosis procedure without compromising the diagnosis accuracy (DA).
- I. PomeranzM. E. AmyeenS. Venkataraman
- 2017
Computer Science, Engineering
ACM Trans. Design Autom. Electr. Syst.
The volume of fail data is addressed by considering the test set that is used for collecting fail data by observing that certain faults from a set of target faults produce significantly larger numbers of faulty output values than other faults under a given test set.
- 6
- Shraddha BodheI. PomeranzM. E. AmyeenS. Venkataraman
- 2017
Computer Science, Engineering
IEEE Transactions on Very Large Scale Integration…
Test reordering targets logic defects based on information that is derived during defect diagnosis and indicates that test reordering helps to terminate fail data collection early without impacting the diagnosis quality.
- 3
- I. PomeranzS. Venkataraman
- 2020
Engineering, Computer Science
IEEE Transactions on Computer-Aided Design of…
This article describes a procedure for modifying a stored test set to reduce the fail data volume under a test data compression method where a linear-feedback shift-register is used for on-chip decompression.
- 1
- Chenlei FangQicheng HuangShawn Blanton
- 2021
Computer Science, Engineering
2021 IEEE 39th VLSI Test Symposium (VTS)
A new algorithm is described for dynamically selecting the test pattern order that leads to significant reduction in memory cost, and uses as little as 1/500 of tester space to store failing data.
- Shraddha BodheM. E. AmyeenClariza GalendezHouston MooersI. PomeranzS. Venkataraman
- 2016
Computer Science, Engineering
2016 IEEE 34th VLSI Test Symposium (VTS)
The algorithm was implemented in a test program library and integrated into a production fail flow for sort data-log optimization, and yielded a 5x reduction in the test data trasfer time.
- 13
- Highly Influenced
- I. PomeranzM. E. Amyeen
- 2021
Engineering, Computer Science
ACM Trans. Design Autom. Electr. Syst.
This article describes a logic diagnosis procedure, from the class of procedures used by commercial tools, that addresses the challenge of balancing the use of the two types of data to produce accurate logic diagnosis results.
- 3
- I. Pomeranz
- 2023
Engineering, Computer Science
IEEE Transactions on Computer-Aided Design of…
This article considers the selection of the partially specified fault-free output response a priori and presents experimental results to demonstrate that the fail data volume is reduced significantly, and accurate logic diagnosis is possible with the reduced fail data.
- 1
- Sarmad TanwirS. PrabhuM. HsiaoL. Lingappan
- 2015
Computer Science, Engineering
2015 IEEE International Test Conference (ITC)
A number of metrics based on information theory that may help in selecting failure logs dynamically for improving the accuracy and resolution of final diagnosis are proposed.
- 23
- I. Pomeranz
- 2022
Engineering, Computer Science
IEEE Transactions on Computer-Aided Design of…
The article describes a test generation procedure for bounded transparent scan that uses only pass/fail data, and targets the same diagnostic quality as a conventional scan-based test set with full fail data.
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16 References
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Asia and South Pacific Conference on Design…
To use techniques for reducing the size of fault pairs to be considered at a time, to use novel variants of the fault distinguishing table method for combinational circuits and reverse order restoration method for sequential circuits, and to introduce heuristics to manage the space complexity of considering all fault pairs for large circuits.
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Computer Science, Engineering
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The proposed methodology enables seamless reuse of the existing standard ATPG based diagnosis infrastructure with compressed test data and indicates that the diagnostic resolution of devices with embedded compression is comparable with that of devices without embedded compression.
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Computer Science, Engineering
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Results from several simulated and over 800 failing ICs reveal a significant improvement in localization and an accurate model of the logic-level defect behavior that provides useful insight into the actual defect mechanism.
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2009 14th IEEE European Test Symposium
An integer linear program (ILP) formulation using a fault diagnostic table is given and generalized fault independence is defined, which identifies many fault pairs that are guaranteed to be distinguished, significantly reducing the number of ILP constraints.
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Computer Science, Engineering
2011 IEEE International Symposium on Defect and…
This paper proposes an approach for improving the diagnostic capability of a test-set used in the initial phases of the diagnosis process, when the system is quickly tested with a set of vectors…
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Computer Science
2010 13th Euromicro Conference on Digital System…
This paper focuses on the evolution of the BBN nodes probabilities, to define a stop criterion to interrupt the diagnosis process when additional test outcomes would not provide further useful information for identifying the faulty candidate.
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Mathematics, Computer Science
IEEE Trans. Inf. Theory
The nearest neighbor decision rule assigns to an unclassified sample point the classification of the nearest of a set of previously classified points, so it may be said that half the classification information in an infinite sample set is contained in the nearest neighbor.
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